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"Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects."
Xijiang Lin et al. (2006)
- Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo:

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS 2006: 139-146

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