"Reducing Test Application Time and Power Dissipation for Scan-Based ..."

Kuen-Jong Lee, Jih-Jeen Chen (2002)

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DOI: 10.1109/ATS.2002.1181734

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kuen-Jong Lee, Jih-Jeen Chen:
Reducing Test Application Time and Power Dissipation for Scan-Based Testing via Multiple Clock Disabling. Asian Test Symposium 2002: 338-

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