"Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA."

Noriyoshi Itazaki et al. (1998)

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DOI: 10.1109/ATS.1998.741624

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita:
Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. Asian Test Symposium 1998: 272-277

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