"Fail Pattern Identification for Memory Built-In Self-Repair."

Rei-Fu Huang et al. (2004)

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DOI: 10.1109/ATS.2004.43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371

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