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"Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults."
Yoshinobu Higami et al. (2008)
- Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu:

Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults. ATS 2008: 97-102

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