"Observation Time Reduction for IDDQ Testing of Briding Faults in ..."

Yoshinobu Higami, Kewal K. Saluja, Kozo Kinoshita (1998)

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DOI: 10.1109/ATS.1998.741631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Kewal K. Saluja, Kozo Kinoshita:
Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits. Asian Test Symposium 1998: 312-317

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