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"CMOS Open Defect Detection Based on Supply Current in Time-Variable ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Masaki Hashizume et al. (2001)

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DOI: 10.1109/ATS.2001.990269

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/HashizumeIYT01
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  persistent URL:
  - https://dblp.org/rec/conf/ats/HashizumeIYT01
Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. Asian Test Symposium 2001: 117-122

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