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"Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes."
Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada (2012)
- Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada:

Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes. ASYNC 2012: 150-157

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