"Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised ..."

Go Nishikawa et al. (2025)

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DOI: 10.1109/ASRU65441.2025.11434711

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-14

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Go Nishikawa, Wataru Nakata, Yuki Saito, Kanami Imamura, Hiroshi Saruwatari, Tomohiko Nakamura:
Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer. ASRU 2025: 1-4

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