"Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length ..."

Morikazu Tsuno et al. (1998)

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DOI: 10.1109/ASPDAC.1998.669419

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-02

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Morikazu Tsuno, Masato Suga, Masayasu Tanaka, Kentaro Shibahara, Mitiko Miura-Mattausch, Masataka Hirose:
Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length MOSFET's. ASP-DAC 1998: 111-116

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