"Towards the next generation of low-power test technologies."

Xiaoqing Wen (2011)

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DOI: 10.1109/ASICON.2011.6157164

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Xiaoqing Wen:
Towards the next generation of low-power test technologies. ASICON 2011: 232-235

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