"High Reliability GaN FET Gate Drivers for Next-generation Power ..."

Xin Ming et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983566

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Xin Ming, Zhi-Wen Zhang, Ziwei Fan, Yao Qin, Yuan-Yuan Liu, Bo Zhang:
High Reliability GaN FET Gate Drivers for Next-generation Power Electronics Technology. ASICON 2019: 1-4

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