"A test approach of combining partial scan with functional testing for high ..."

Quanquan Li et al. (2011)

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DOI: 10.1109/ASICON.2011.6157201

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Quanquan Li, Yingke Gao, Tiejun Zhang, Chaohuan Hou:
A test approach of combining partial scan with functional testing for high performance processors. ASICON 2011: 381-384

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