"STVL: Improve the Precision of Static Defect Detection with Symbolic ..."

Yunshan Zhao et al. (2011)

> Home

Details and statistics

DOI: 10.1109/APSEC.2011.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/apsec/ZhaoWGCXY11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/apsec/ZhaoWGCXY11
Yunshan Zhao, Yawen Wang, Yunzhan Gong, Honghe Chen, Qing Xiao, Zhaohong Yang:
STVL: Improve the Precision of Static Defect Detection with Symbolic Three-Valued Logic. APSEC 2011: 179-186

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.