"BIST approach for testing configurable logic and memory resources in FPGAs."

Zhiquan Zhang et al. (2008)

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DOI: 10.1109/APCCAS.2008.4746383

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-06

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Zhiquan Zhang, Zhiping Wen, Lei Chen, Tao Zhou, Fan Zhang:
BIST approach for testing configurable logic and memory resources in FPGAs. APCCAS 2008: 1767-1770

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