"OCR is All you need: Importing Multi-Modality into Image-based Defect ..."

Chih-Chung Hsu et al. (2024)

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DOI: 10.1109/APCCAS62602.2024.10808400

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-31

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Chih-Chung Hsu, Chia-Ming Lee, Po-Tsun Yu, Chun-Hung Sun, Kuang-Ming Wu:
OCR is All you need: Importing Multi-Modality into Image-based Defect Classification System. APCCAS 2024: 641-645

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