"2D-PPC: A single-correction multiple-detection method for ..."

Khanh N. Dang et al. (2019)

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DOI: 10.1109/APCCAS47518.2019.8953131

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Khanh N. Dang, Michael Conrad Meyer, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan-Tu Tran:
2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults. APCCAS 2019: 109-112

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