


default search action
"Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem."
Walid Ibrahim, Amr El-Chouemi, Hesham El-Sayed (2006)
- Walid Ibrahim

, Amr El-Chouemi, Hesham El-Sayed:
Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem. AICCSA 2006: 402-408

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID












