"Reliability analysis and loading application in circuits for next ..."

Miin-Jong Hao, Weng-Cheng Kao (2013)

> Home

Details and statistics

DOI: 10.1109/ICICS.2013.6782976

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/IEEEicics/HaoK13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/IEEEicics/HaoK13
Miin-Jong Hao, Weng-Cheng Kao:
Reliability analysis and loading application in circuits for next generation transport networks. ICICS 2013: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.