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G. Vanderschaeve

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Journal Articles

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2009
[j3]
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  - journals/mr/MartineauMLDLV09
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  - https://dblp.org/rec/journals/mr/MartineauMLDLV09
Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve:
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49(9-11): 1330-1333 (2009)
2007
[j2]
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  - journals/mr/KhongLTDCLVS07
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B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid:
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47(9-11): 1735-1740 (2007)
2005
[j1]
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B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin:
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45(9-11): 1717-1722 (2005)

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