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ORCIDYu Sun 0064
Person information
- affiliation: Hefei University of Technology, School of Instrument Science and Optoelectronics Engineering, China
Other persons with the same name
- Yu Sun — disambiguation page
- Yu Sun 0001
![[0000-0001-7895-0741]](https://devdomain4test.ir/img/orcid-mark.12x12.png "0000-0001-7895-0741")
— University of Toronto, Department of Mechanical and Industrial Engineering, Canada - Yu Sun 0002 — California State Polytechnic University, Pomona (Cal Poly Pomona). (and 2 more)
- Yu Sun 0003 — University of Central Arkansas (and 1 more)
- Yu Sun 0004 — University of South Florida, Bellini College of Artificial Intelligence, Cybersecurity and Computing, Tampa, FL, USA (and 3 more)
- Yu Sun 0005 — Institute of Computing Technology CAS (and 1 more)
- Yu Sun 0006 — MathWorks (and 1 more)
- Yu Sun 0007 — University of California, Riverside, CA, USA
- Yu Sun 0008 — Northeastern University, Shenyang
- Yu Sun 0009 — General Motors (and 1 more)
- Yu Sun 0010 — Changchun University
- Yu Sun 0011 — The University of Michigan, Dearborn
- Yu Sun 0012 — The University of Texas at Austin
- Yu Sun 0013 — Department of Mathematics, Wayne State University
- Yu Sun 0014 — Zhejiang University, Department of Biomedical Engineering, Hangzhou, China (and 3 more)
- Yu Sun 0015 — Beihang University, School of Cyber Science and Technology, Beijing, China (and 2 more)
- Yu Sun 0016 — Beijing Jiaotong University, Institute of Information Science / Beijing Key Laboratory of Advanced Information Science and Network Technology, China
- Yu Sun 0017 — Harbin Engineering University, China
- Yu Sun 0018 — Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology, China (and 1 more)
- Yu Sun 0019 — Southern University of Science and Technology, Department of Computer Science and Engineering, Shenzhen Key Laboratory of Computational Intelligence, China (and 1 more)
- Yu Sun 0020 — Stanford University, CA, USA (and 1 more)
- Yu Sun 0021 — Twitter (and 2 more)
- Yu Sun 0022 — Washington University in St. Louis, MO, USA
- Yu Sun 0023 — Beijing Normal University, Beijing, China
- Yu Sun 0024 — University of Illinois at Urbana-Champaign, USA
- Yu Sun 0025 — Siemens Corporation, Corporate Research and Technology, Knowledge and Decision Systems, Princeton, NJ, USA
- Yu Sun 0026 — Southeast University, School of Biological Sciences and Medical Engineering, Nanjing, China (and 1 more)
- Yu Sun 0027 — Nankai University, China (and 1 more)
- Yu Sun 0028 — Harbin Institute of Technology, Research Center for Space Optical Engineering, Heilongjiang, China
- Yu Sun 0029 — Baidu Inc., Beijing, China
- Yu Sun 0030 — Harbin Institute of Technology, China (and 1 more)
- Yu Sun 0031 — Shanghai AI Laboratory, Shanghai, China (and 1 more)
- Yu Sun 0032 — Nanjing University, School of Electronic Science and Engineering, China
- Yu Sun 0033 — Xi'an Jiaotong University, School of Mechanical Engineering, China (and 1 more)
- Yu Sun 0034 — General Hospital of Northern Theater Command, Department of Radiology, Shenyang, China (and 2 more)
- Yu Sun 0035 — Guangxi University, School of Computer and Electronics and Information, Nanning, China
- Yu Sun 0036 — Dalian Maritime University, College of Information Science and Technology, China
- Yu Sun 0037 — Fuzhou University, Academy of Digital China (Fujian), MOE Key Laboratory of Spatial Data Mining and Information Sharing, China
- Yu Sun 0038 — Tianjin University, School of Microelectronics, China
- Yu Sun 0039 — Colorado State University, School of Advanced Materials Discovery, Fort Collins, CO, USA
- Yu Sun 0040 — Jiangnan University, School of Mechanical Engineering, Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment and Technology, Wuxi, China
- Yu Sun 0041 — University of California, Berkeley, CA, USA
- Yu Sun 0042 — Yunnan Normal University, School of Information, Kunming, China
- Yu Sun 0043 — Zhejiang University, School of Micro-Nano Electronics, Hangzhou, China
- Yu Sun 0044 — Clemson University, SC, USA
- Yu Sun 0045 — Qingdao University, School of Automation, Shandong key Laboratory of Industrial Control Technology, China
- Yu Sun 0046 — National Tsing Hua University, Department of Education and Learning Technology, Hsinchu, Taiwan
- Yu Sun 0047 — Beihang University, School of Astronautics, Department of Aerospace Information Engineering, Beijing, China
- Yu Sun 0048 — Zhejiang University, State Key Laboratory of Industrial Control Technology, Hangzhou, China
- Yu Sun 0049 — University of St. Gallen, Switzerland
- Yu Sun 0050 — Sun Yat-sen University, School of Environmental Science and Engineering, Guangzhou, China
- Yu Sun 0051 — Shandong University, Qingdao, China
- Yu Sun 0052 — University of Science and Technology of China, Hefei, China (and 1 more)
- Yu Sun 0053 — Jilin University, School of Management, Changchun, China
- Yu Sun 0054 — Zhengzhou University, School of Information Management, China
- Yu Sun 0055 — Beijing University of Technology, Beijing Key Laboratory of Traffic Engineering, China
- Yu Sun 0056 — Northeast Petroleum University, School of Earth Sciences, Daqing, China
- Yu Sun 0057 — Dongfang Electronics Company Ltd., Yantai, China
- Yu Sun 0058 — Yunnan Normal University, School of Physics and Electronic Information Technology, Kunming, China
- Yu Sun 0059 — Beijing University of Technology, Faculty of Information Technology, China
- Yu Sun 0060 — Army Engineering University of PLA, Command and Control Engineering College, Nanjing, China (and 1 more)
- Yu Sun 0061 — Lanzhou University, School of Information Science and Engineering, China
- Yu Sun 0062 — University of Glasgow, Department of Sociology, UK (and 2 more)
- Yu Sun 0063 — Nanjing University, School of Electronic Science and Engineering, China
- Yu Sun 0065 — Guangdong University of Science and Technology, School of Management, Dongguan, China (and 1 more)
- Yu Sun 0066 — Kobe University, Graduate School of System Informatics, Japan
- Yu Sun 0067 — State Grid Corporation of China, Shenyang, China (and 1 more)
- Yu Sun 0068 — Sichuan Provincial Meteorological Service, Chengdu, China
- Yu Sun 0069 — En Chu Kong Hospital, Department of Neurology, New Taipei City, Taiwan
- Yu Sun 0070 — Institute of Health Service and Transfusion Medicine, Beijing, China (and 1 more)
- Yu Sun 0071 — Jilin University, College of Communication Engineering, Department of Information, Changchun, China
- Yu Sun 0072 — Xi'an University of Science and Technology, College of Computer Science and Technology, China
- Yu Sun 0073 — Capital Medical University, Tiantan Hospital, Department of Ultrasound, Beijing, China
- Yu Sun 0074 — Xi'an Aerospace Precision Electromechanical Institute, China
- Yu Sun 0075 — Sunrise Technology Inc., Stony Brook, NY, USA
- Yu Sun 0076 — Indeed Inc., Sunnyvale, CA, USA (and 1 more)
- Yu Sun 0077 — Dalian University of Technology, DUT School of Software Technology & DUT-RU International School of Information Science and Engineering, China
- Yu Sun 0078 — National University of Singapore, School of Computing, Singapore
- Yu Sun 0079 — Chinese Academy of Sciences, Aerospace Information Research Institute, Key Laboratory of Electromagnetic Radiation and Sensing Technology, China
- Yu Sun 0080 — Northeast Petroleum University, School of Electrical and Information Engineering, Heilongjiang, China
- Yu Sun 0081 — Northeastern University, College of Science, Boston, MA, USA
- Yu Sun 0082 — Swinburne University of Technology, Hawthorn, VIC, Australia
- Yu Sun 0083 — Tianjin University, School of Electrical and Information Engineering, China
- Yu Sun 0084 — Open University of China, Lifelong Education Research Institute, Information Department, Beijing, China
- Yu Sun 0085 — Harbin Engineering University, College of Shipbuilding Engineering, China
- Yu Sun 0086 — Beijing Jiaotong University, School of Electronic and Information Engineering, China
- Yu Sun 0087 — Fuzhou University, MOE Key Laboratory of Spatial Data Mining and Information Sharing, China
- Yu Sun 0088 — ByteDance Inc., San Jose, CA, USA
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- 2025
[j1]Xiang Zhong, Yu Sun, Guangcheng Zhou, Yujia Liu, Yikai Zhu, Huaxia Deng, Mengchao Ma, Dong Chen, Xinglong Gong:
Statistical-Analysis-Based Imaging-Free Method for Efficient and Fast Wafer Defect Detection. IEEE Trans. Instrum. Meas. 74: 1-6 (2025)
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