The sensitivity of a method to predict a capacitor's frequency characteristic.

Sat, 01 Jan 2000 00:00:00 +0100

Svetlana Avramov-Zamurovic , Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip:
The sensitivity of a method to predict a capacitor's frequency characteristic. IEEE Trans. Instrum. Meas. 49(2): 398-404 (2000)