A transitive closure algorithm for test generation.

Fri, 01 Jan 1993 00:00:00 +0100

Srimat T. Chakradhar, Vishwani D. Agrawal, Steven G. Rothweiler:
A transitive closure algorithm for test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(7): 1015-1028 (1993)