Redundancy removal and test generation for circuits with non-Boolean primitives.

Wed, 01 Jan 1997 00:00:00 +0100

Srimat T. Chakradhar, Steven G. Rothweiler, Vishwani D. Agrawal:
Redundancy removal and test generation for circuits with non-Boolean primitives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(11): 1370-1377 (1997)