A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.

Fri, 01 Jan 1982 00:00:00 +0100

Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66