Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection.

Wed, 01 Jan 2014 00:00:00 +0100

Tomi Roinila , Hongjiang Zeng, Jarmo Verho, Yu Xiao, Matti Vilkko , Pasi Kallio , Jukka Lekkala , Tie Li, Yuelin Wang:
Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection. Microelectron. J. 45(7): 976-980 (2014)