Classifying mixed-defect from single-defect training in imbalanced wafer maps via diffusion and attention.

Thu, 01 Jan 2026 00:00:00 +0100

Daeyeol Yang , Jaeyeon Jang, Chang Ouk Kim:
Classifying mixed-defect from single-defect training in imbalanced wafer maps via diffusion and attention. Expert Syst. Appl. 299: 130127 (2026)