A test vector selection method based on machine learning for efficient presilicon verification.

Tue, 01 Aug 2023 01:00:00 +0200

Hyeong Gu Lim, Jaeyeon Jang , Byung Kook Ju, Jae-Wook Ko, Chang Ouk Kim:
A test vector selection method based on machine learning for efficient presilicon verification. Expert Syst. Appl. 224: 120056 (2023)