Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model.

Sat, 01 Apr 2023 01:00:00 +0200

Jaeyeon Jang, Gyeong Taek Lee:
Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model. Expert Syst. Appl. 215: 119363 (2023)