Advanced virtual metrology using distribution alignment loss for practical quality control.

Wed, 01 Jan 2025 00:00:00 +0100

Yu Gyeong Ji, In Ho Kim, Minjeong Shin, Gyeong Taek Lee , Jaeyeon Jang:
Advanced virtual metrology using distribution alignment loss for practical quality control. Int. J. Prod. Res. 63(23): 9051-9069 (2025)