Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels.

Fri, 01 Jan 2021 00:00:00 +0100

Seyoung Park, Jaeyeon Jang , Chang Ouk Kim :
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. J. Intell. Manuf. 32(1): 251-263 (2021)