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International Conference on Social Networks Analysis, Management and Security (SNAMS)
12th SNAMS 2025: Vienna, Austria
- Kai Erenli, Yaser Jararweh:

12th International Conference on Social Networks Analysis, Management and Security, SNAMS 2025, Vienna, Austria, November 25-28, 2025. IEEE 2025, ISBN 979-8-3315-9412-1 [contents]
11th SNAMS 2024: Gran Canaria, Spain
- Muhannad Quwaider, Elhadj Benkhelifa:

11th International Conference on Social Networks Analysis, Management and Security, SNAMS 2024, Gran Canaria, Spain, December 9-11, 2024. IEEE 2024, ISBN 979-8-3315-1834-9 [contents]
10th SNAMS 2023: Abu Dhabi, UAE
- Tenth International Conference on Social Networks Analysis, Management and Security, SNAMS 2023, Abu Dhabi, United Arab Emirates, November 21-24, 2023. IEEE 2023, ISBN 979-8-3503-1890-6 [contents]

9th SNAMS 2022: Milan, Italy
- Paolo Ceravolo, Christian Guetl, Yaser Jararweh, Elhadj Benkhelifa:

Ninth International Conference on Social Networks Analysis, Management and Security, SNAMS 2022, Milan, Italy, November 29 - Dec. 1, 2022. IEEE 2022, ISBN 979-8-3503-2048-0 [contents]
8th SNAMS 2021: Gandia, Spain
- Eighth International Conference on Social Network Analysis, Management and Security, SNAMS 2021, Gandia, Spain, December 6-9, 2021. IEEE 2021, ISBN 978-1-6654-9495-3 [contents]

7th SNAMS 2020: Virtual Event, France
- Christian Gütl, Imad Saleh, Paolo Caravolo, Yaser Jararweh, Elhadj Benkhelifa:

Seventh International Conference on Social Networks Analysis, Management and Security, SNAMS 2020, Virtual Event, France, December 14-16, 2020. IEEE 2020, ISBN 978-0-7381-1180-3 [contents]
6th SNAMS 2019: Granada, Spain
- Mohammad A. Alsmirat, Yaser Jararweh:

Sixth International Conference on Social Networks Analysis, Management and Security, SNAMS 2019, Granada, Spain, October 22-25, 2019. IEEE 2019, ISBN 978-1-7281-2946-4 [contents]
5th SNAMS 2018: Valencia, Spain
- Fifth International Conference on Social Networks Analysis, Management and Security, SNAMS 2018, Valencia, Spain, October 15-18, 2018. IEEE 2018, ISBN 978-1-5386-9588-3 [contents]


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