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ORCID25th ISSRE 2014: Naples, Italy
- 25th IEEE International Symposium on Software Reliability Engineering, ISSRE 2014, Naples, Italy, November 3-6, 2014. IEEE Computer Society 2014, ISBN 978-1-4799-6032-3
Session I: Best Paper Nominees
- Naaliel Mendes, Henrique Madeira
, João Durães:
Security Benchmarks for Web Serving Systems. 1-12 - Hong Lu, Tao Yue, Shaukat Ali, Kunming Nie, Li Zhang:
Zen-CC: An Automated and Incremental Conformance Checking Solution to Support Interactive Product Configuration. 13-22 - James Walden, Jeff Stuckman, Riccardo Scandariato:
Predicting Vulnerable Components: Software Metrics vs Text Mining. 23-33
Session II: Modeling
- Jesús Sánchez Cuadrado, Esther Guerra, Juan de Lara:
Uncovering Errors in ATL Model Transformations Using Static Analysis and Constraint Solving. 34-44 - Jinhee Park, Nakwon Lee, Jongmoon Baik:
On the Long-Term Predictive Capability of Data-Driven Software Reliability Model: An Empirical Evaluation. 45-54 - Raymond Devillers, Jean-Yves Didier, Hanna Klaudel, Johan Arcile:
Deadlock and Temporal Properties Analysis in Mixed Reality Applications. 55-65
Session III: Program Logic
- Fangfang Zhang, Dinghao Wu, Peng Liu, Sencun Zhu:
Program Logic Based Software Plagiarism Detection. 66-77 - Bastian Zimmer, Christoph Dropmann, Jochen Ulrich Hanger:
A Systematic Approach for Software Interference Analysis. 78-87 - Ding Ye, Yu Su, Yulei Sui, Jingling Xue:
WPBOUND: Enforcing Spatial Memory Safety Efficiently at Runtime with Weakest Preconditions. 88-99 - Aleksandar Milenkoski, Bryan D. Payne, Nuno Antunes, Marco Vieira, Samuel Kounev:
Experience Report: An Analysis of Hypercall Handler Vulnerabilities. 100-111
Session IV: Fault Localization
- Birgit Hofer, Franz Wotawa:
Why Does my Spreadsheet Compute Wrong Values? 112-121 - Hao Hu, Hongyu Zhang, Jifeng Xuan, Weigang Sun:
Effective Bug Triage Based on Historical Bug-Fix Information. 122-132 - Wolfgang Hogerle, Friedrich Steimann, Marcus Frenkel:
More Debugging in Parallel. 133-143
Session V: Case Studies I
- Keun Soo Yim:
Norming to Performing: Failure Analysis and Deployment Automation of Big Data Software Developed by Highly Iterative Models. 144-155 - Nuno Silva, Marco Vieira:
Experience Report: Orthogonal Classification of Safety Critical Issues. 156-166 - Xin Chen, Charng-Da Lu, Karthik Pattabiraman:
Failure Analysis of Jobs in Compute Clouds: A Google Cluster Case Study. 167-177
Session VI: Data Analysis
- Catello Di Martino, Daniel Chen, Geetika Goel, Rajeshwari Ganesan, Zbigniew T. Kalbarczyk, Ravishankar K. Iyer:
Analysis and Diagnosis of SLA Violations in a Production SaaS Cloud. 178-188 - Rahul Gopinath, Carlos Jensen, Alex Groce:
Mutations: How Close are they to Real Faults? 189-200 - Ermira Daka, Gordon Fraser:
A Survey on Unit Testing Practices and Problems. 201-211
Session VII: Industrial Systems
- Marcello Cinque, Domenico Cotroneo, Raffaele Della Corte, Antonio Pecchia:
Assessing Direct Monitoring Techniques to Analyze Failures of Critical Industrial Systems. 212-222 - Sagar Sen, Carlo Ieva, Arnab Sarkar, Atle Sander, Astrid Grime:
Experience Report: Verifying Data Interaction Coverage to Improve Testing of Data-Intensive Systems: The Norwegian Customs and Excise Case Study. 223-234 - Normann Decker, Franziska Kühn, Daniel Thoma:
Runtime Verification of Web Services for Interconnected Medical Devices. 235-244
Session VIII: Case Studies II
- JeeHyun Hwang, Da Young Lee, Laurie A. Williams, Mladen A. Vouk:
Access Control Policy Evolution: An Empirical Study. 245-254 - Roland Mader, Rene Obendrauf, Philipp Prinz, Gerhard Griessnig:
Experience Report: A Safety Engineering Tool Supporting Error Model Creation and Visualization. 255-266 - Davide G. Cavezza, Roberto Pietrantuono, Javier Alonso, Stefano Russo, Kishor S. Trivedi:
Reproducibility of Environment-Dependent Software Failures: An Experience Report. 267-276
Session IX: Software Testing
- Jie Zhang, Muyao Zhu, Dan Hao, Lu Zhang:
An Empirical Study on the Scalability of Selective Mutation Testing. 277-287 - Nesa Asoudeh, Yvan Labiche:
Multi-objective Construction of an Entire Adequate Test Suite for an EFSM. 288-299 - Kim Herzig:
Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models. 300-311
Session X: Applications of Machine Learning
- Huihua Lu, Ekrem Kocaguneli, Bojan Cukic:
Defect Prediction between Software Versions with Active Learning and Dimensionality Reduction. 312-322 - Sunint Kaur Khalsa, Yvan Labiche:
An Orchestrated Survey of Available Algorithms and Tools for Combinatorial Testing. 323-334 - Tien-Duy B. Le, Ferdian Thung, David Lo:
Predicting Effectiveness of IR-Based Bug Localization Techniques. 335-345
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