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ORCID3rd DeepTest@ICSE 2021: Madrid, Spain
- 3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021. IEEE 2021, ISBN 978-1-6654-4565-8
- Samuel Ackerman, Parijat Dube, Eitan Farchi, Orna Raz, Marcel Zalmanovici:
Machine Learning Model Drift Detection Via Weak Data Slices. 1-8 - A. Giuliano Mirabella, Alberto Martin-Lopez
, Sergio Segura, Luis Valencia-Cabrera, Antonio Ruiz-Cortés:
Deep Learning-Based Prediction of Test Input Validity for RESTful APIs. 9-16 - Michael Weiss, Rwiddhi Chakraborty, Paolo Tonella:
A Review and Refinement of Surprise Adequacy. 17-24 - Niranjhana Narayanan, Karthik Pattabiraman:
TF-DM: Tool for Studying ML Model Resilience to Data Faults. 25-28
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