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ORCID19th FMICS 2014: Florence, Italy
- Frédéric Lang, Francesco Flammini
:
Formal Methods for Industrial Critical Systems - 19th International Conference, FMICS 2014, Florence, Italy, September 11-12, 2014. Proceedings. Lecture Notes in Computer Science 8718, Springer 2014, ISBN 978-3-319-10701-1 - Muhammad Ahmad, Osman Hasan:
Formal Verification of Steady-State Errors in Unity-Feedback Control Systems. 1-15 - Thang Nguyen, Dejan Nickovic:
Assertion-Based Monitoring in Practice - Checking Correctness of an Automotive Sensor Interface. 16-32 - Pontus Boström, Petr Alexeev, Mikko Heikkilä, Mikko Huova, Marina Waldén, Matti Linjama:
Analysis of Real-Time Properties of a Digital Hydraulic Power Management System. 33-47 - Zhen Zhang, Wendelin Serwe, Jian Wu, Tomohiro Yoneda, Hao Zheng, Chris J. Myers:
Formal Analysis of a Fault-Tolerant Routing Algorithm for a Network-on-Chip. 48-62 - Lars Lockefeer, David M. Williams, Wan J. Fokkink:
Formal Specification and Verification of TCP Extended with the Window Scale Option. 63-77 - Paul Fiterau-Brostean, Ramon Janssen, Frits W. Vaandrager:
Learning Fragments of the TCP Network Protocol. 78-93 - Andrea Bonacchi, Alessandro Fantechi:
On the Validation of an Interlocking System by Model-Checking. 94-108 - Franco Mazzanti, Giorgio Oronzo Spagnolo, Simone Della Longa, Alessio Ferrari:
Deadlock Avoidance in Train Scheduling: A Model Checking Approach. 109-123 - Henning Basold, Henning Günther, Michaela Huhn, Stefan Milius:
An Open Alternative for SMT-Based Verification of Scade Models. 124-139 - Sandrine Blazy, David Bühler, Boris Yakobowski:
Improving Static Analyses of C Programs with Conditional Predicates. 140-154 - Christian Ellen, Sven Sieverding, Hardi Hungar:
Detecting Consistencies and Inconsistencies of Pattern-Based Functional Requirements. 155-169 - Ugo Gentile, Stefano Marrone, Gianluca Mele, Roberto Nardone, Adriano Peron:
Test Specification Patterns for Automatic Generation of Test Sequences. 170-184 - Brian Campbell, Ian Stark:
Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation. 185-199
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