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ORCID34th DFT 2019: Noordwijk, Netherlands
- 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. IEEE 2019, ISBN 978-1-7281-2260-1
- Fritz G. Previlon, Charu Kalra, David R. Kaeli, Paolo Rech:
A Comprehensive Evaluation of the Effects of Input Data on the Resilience of GPU Applications. 1-6 - Alberto Bosio, Ian O'Connor
, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui:
Rebooting Computing: The Challenges for Test and Reliability. 8138-8143 - Antonio J. Sánchez, Yubal Barrios, Lucana Santos, Roberto Sarmiento:
Evaluation of TMR effectiveness for soft error mitigation in SHyLoC compression IP core implemented on Zynq SoC under heavy ion radiation. 1-4 - Shanshan Liu, Pedro Reviriego, Kazuteru Namba, Salvatore Pontarelli, Liyi Xiao, Fabrizio Lombardi:
Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells. 1-4 - Daniel Oliveira, Philippe O. A. Navaux, Paolo Rech:
Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel Applications. 1-6 - Giulio Gambardella, Johannes Kappauf, Michaela Blott, Christoph Doehring, Martin Kumm, Peter Zipf, Kees A. Vissers:
Efficient Error-Tolerant Quantized Neural Network Accelerators. 1-6 - Zhen Gao, Jinhua Zhu, Lina Yan, Tong Yan, Pedro Reviriego:
Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAs. 1-4 - Ana Lasheras, Ramon Canal, Eva Rodríguez, Luca Cassano:
Protecting RSA Hardware Accelerators against Differential Fault Analysis through Residue Checking. 1-6 - Masayoshi Yoshimura, Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa:
A State Assignment Method to Improve Transition Fault Coverage for Controllers. 1-4 - Donald Kline Jr., Stephen Longofono, Rami G. Melhem, Alex K. Jones:
Predicting Single Event Effects in DRAM. 1-6 - Annachiara Ruospo, Riccardo Cantoro, Ernesto Sánchez, Pasquale Davide Schiavone, Angelo Garofalo, Luca Benini:
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification. 1-6 - Satyadev Ahlawat, Jaynarayan T. Tudu, Manoj Singh Gaur, Masahiro Fujita, Virendra Singh:
Preventing Scan Attack through Test Response Encryption. 1-6 - Boyang Du, Sarah Azimi, Corrado De Sio, Ludovica Bozzoli, Luca Sterpone:
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA. 1-6 - Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff:
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. 1-4 - Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu:
Challenges of Reliability Assessment and Enhancement in Autonomous Systems. 1-6 - Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue:
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines. 1-6 - Alessandro Vallero, Stefano Di Carlo:
Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems. 8138-8143 - Jiaqiang Li, Pedro Reviriego, Liyi Xiao, Alexander Klockmann:
Protecting Large Word Size Memories against MCUs with 3-bit Burst Error Correction. 1-4 - Danny Santoso, Hyeran Jeon:
Understanding of GPU Architectural Vulnerability for Deep Learning Workloads. 1-6 - Christian M. Fuchs, Pai H. Chou, Xiaoqing Wen, Nadia M. Murillo, Gianluca Furano, Stefan Holst, Antonis Tavoularis, Shyue-Kung Lu, Aske Plaat, Kostas Marinis:
A Fault-Tolerant MPSoC For CubeSats. 1-6 - Stefano Di Mascio, Alessandra Menicucci, Eberhard K. A. Gill, Gianluca Furano, Claudio Monteleone:
On the Criticality of Caches in Fault-Tolerant Processors for Space. 1-4 - Mahsa Mousavi, Hamid Reza Pourshaghaghi, Henk Corporaal, Akash Kumar:
Scatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration Memory. 1-6 - Markus Ulbricht, Rizwan Tariq Syed, Milos Krstic:
Developing a Configurable Fault Tolerant Multicore System for Optimized Sensor Processing. 1-4 - Toshinori Hosokawa, Hiroshi Yamazaki, Kenichiro Misawa, Masayoshi Yoshimura, Yuki Hirama, Masavuki Arai:
A Low Capture Power Oriented X-filling Method Using Partial MaxSAT Iteratively. 1-6 - Avishek Choudhury, Biplab K. Sikdar:
CORE-VR: A Coherence and Reusability Aware Low Voltage Fault Tolerant Cache in Multicore. 1-4 - Luca Gnoli, Giuseppe Carnicelli, Alessio Parisi, Luca Urbinati, Burim Kabashi, Fabio Michieletti, Sebastian Ignacio Peradotto Ibarra, Marco Vacca, Mariagrazia Graziano, Jimson Mathew, Marco Ottavi:
Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor Sensing. 1-4 - Nikos Foutris, Christos Kotselidis, Mikel Luján:
Simulating Wear-out Effects of Asymmetric Multicores at the Architecture Level. 1-6 - Lucas Matana Luza, Alexandre Besser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo:
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory. 1-6 - Alexander Zeh, Manuela Meier, Viola Rieger:
Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream Cipher. 1-4 - Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren:
Detecting SEUs in Noisy Digital Imagers with small pixels. 1-6 - Tsai-Ling Tsai, Jin-Fu Li, Chun-Lung Hsu, Chi-Tien Sun:
Testing of In-Memory-Computing 8T SRAMs. 1-4 - Aleksandar Simevski, Patryk Skoncej, Cristiano Calligaro, Milos Krstic:
Scalable and Configurable Multi-Chip SRAM in a Package for Space Applications. 1-6 - Feroze Merchant, Anandraj Devarajan, Anik Basu, David Ashen, Brandon Yelton, Prashant D. Joshi:
High Performance Memory Repair. 1-4
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